Multiple Defects Cause Degradation After High Field Stress in AlGaN/GaN HEMTs

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2018
Source ID
10.1109/tdmr.2018.2847338

Entities

People

  • Daniel M. Fleetwood
  • En Xia Zhang
  • Erin C.h. Kyle
  • James S. Speck
  • Jin Chen
  • Jingtian Fang
  • Pan Wang
  • Ronald D. Schrimpf
  • Rong Jiang
  • Sokrates T. Pantelides
  • Stephen W. Kaun
  • Xiao Shen

Organizations

  • Air Force Office of Scientific Research
  • Air Force Research Laboratory
  • Defense Threat Reduction Agency
  • National Science Foundation