Impact Ionization and Interface Trap Generation in 28-nm MOSFETs at Cryogenic Temperatures

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2018
Source ID
10.1109/tdmr.2018.2865190

Entities

People

  • Han Wang
  • Hugh Barnaby
  • Ivan Sanchez Esqueda
  • Xiaodong Yan

Organizations

  • Defense Advanced Research Projects Agency