Worst-Case Bias for High Voltage, Elevated-Temperature Stress of AlGaN/GaN HEMTs

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 01, 2020
Source ID
10.1109/tdmr.2020.2986401

Entities

People

  • B. S. Poling
  • Daniel M. Fleetwood
  • E. R. Heller
  • En Xia Zhang
  • Michael W. McCurdy
  • Pengfei Wang
  • Ronald D. Schrimpf
  • Rong Jiang
  • Xiangchong Li

Organizations

  • Air Force Research Laboratory