Probing the Atomic-Scale Mechanisms of Time-Dependent Dielectric Breakdown in Si/SiO2 MOSFETs (June 2022)
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 01, 2022
- Source ID
- 10.1109/tdmr.2022.3186232
Entities
People
- Colin G. McKay
- David Russell Hughart
- Fedor V. Sharov
- Gaddi S. Haase
- Patrick M. Lenahan
- Stephen J. Moxim
Organizations
- Defense Threat Reduction Agency
- Pennsylvania State University
- Sandia National Laboratories