Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 01, 2023
Source ID
10.1109/tdmr.2023.3240976

Entities

People

  • Daniel M. Fleetwood
  • Dimitri Linten
  • En Xia Zhang
  • Jerome Mitard
  • K. Li
  • Pengfei Wang
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Xuyi Luo

Organizations

  • Interuniversity Microelectronics Centre
  • United States Air Force
  • Vanderbilt University