Gate Bias Dependence of Defect-Mediated Hot-Carrier Degradation in GaN HEMTs

Document Details

Document Type
Pub Defense Publication
Publication Date
May 01, 2014
Source ID
10.1109/ted.2014.2309278

Entities

People

  • A. Paccagnella
  • Daniel M. Fleetwood
  • Jasprit Singh
  • Jin Chen
  • John M. Hinckley
  • Marco Silvestri
  • Ronald D. Schrimpf
  • Shubhajit Mukherjee
  • Sokrates T. Pantelides
  • Tania Roy
  • Yevgeniy Puzyrev

Organizations

  • Office of Naval Research