Relationship Between the 4H-SiC/SiO2 Interface Structure and Electronic Properties Explored by Electrically Detected Magnetic Resonance
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Feb 01, 2015
- Source ID
- 10.1109/ted.2014.2364722
Entities
People
- Aivars J. Lelis
- Corey J. Cochrane
- Mark Anders
- Patrick M. Lenahan
Organizations
- United States Army Research Laboratory
- United States Department of Defense