A Compact Current–Voltage Model for 2D Semiconductor Based Field-Effect Transistors Considering Interface Traps, Mobility Degradation, and Inefficient Doping Effect

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2014
Source ID
10.1109/ted.2014.2365028

Entities

People

  • Jiahao Kang
  • Kaustav Banerjee
  • Wei Cao
  • Wei Liu

Organizations

  • Air Force Research Laboratory

Tags

Technology Areas

  • Microelectronics