Comparison of Methods for Accurate Characterization of Interface Traps in GaN MOS-HFET Devices

Document Details

Document Type: Pub Defense Publication
Publication Date: Feb 01, 2015
Source ID: 10.1109/ted.2014.2382677

Entities

People

Bongmook Lee
Narayanan Ramanan
Veena Misra

Organizations

National Science Foundation
Office of Naval Research