Interface Trap-Induced Nonideality in As-Deposited Ni/4H-SiC Schottky Barrier Diode

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 01, 2015
Source ID
10.1109/ted.2014.2383386

Entities

People

  • Haizheng Song
  • M. V. S. Chandrashekhar
  • Sabih Uddin Omar
  • Tangali S. Sudarshan
  • Tawhid Rana

Organizations

  • National Science Foundation
  • Office of Naval Research