On the Cryogenic RF Linearity of SiGe HBTs in a Fourth-Generation 90-nm SiGe BiCMOS Technology

Document Details

Document Type
Pub Defense Publication
Publication Date
Apr 01, 2015
Source ID
10.1109/ted.2015.2396876

Entities

People

  • Adilson S. Cardoso
  • Adrian Ildefonso
  • Anup P. Omprakash
  • David M. Fleischhauer
  • John D. Cressler
  • Michael A. Oakley
  • Nedeljko Karaulac
  • Nelson E. Lourenco
  • Partha Sarathi Chakraborty
  • Saeed Zeinolabedinzadeh
  • Tikurete G. Bantu

Organizations

  • Defense Threat Reduction Agency