Performance Degradation Analysis and Hot-Carrier Injection Impact on the Lifetime Prediction of $LC$ Voltage Control Oscillator

Document Details

Document Type
Pub Defense Publication
Publication Date
Jul 01, 2015
Source ID
10.1109/ted.2015.2436905

Entities

People

  • Barry P. Linder
  • Chih-hsiang Ho
  • Emily Ray
  • Herschel Ainspan
  • Keith A. Jenkins
  • Peilin Song

Organizations

  • Defense Advanced Research Projects Agency