Hot-Carrier Degradation in GaN HEMTs Due to Substitutional Iron and Its Complexes

Document Details

Document Type
Pub Defense Publication
Publication Date
Apr 01, 2016
Source ID
10.1109/ted.2016.2532806

Entities

People

  • Daniel M. Fleetwood
  • Jin Chen
  • Ronald D. Schrimpf
  • Shubhajit Mukherjee
  • Sokrates T. Pantelides
  • Yevgeniy Puzyrev

Organizations

  • Air Force Office of Scientific Research
  • National Science Foundation
  • Office of Naval Research
  • Samsung Group