Nanometer-Scale Strain Measurements in AlGaN/GaN High-Electron Mobility Transistors During Pulsed Operation
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jul 01, 2016
- Source ID
- 10.1109/ted.2016.2566926
Entities
People
- Eric R. Heller
- Jason P. Jones
- Matthew R Rosenberger
- Samuel Graham
- William P King
Organizations
- Air Force Office of Scientific Research
- National Science Foundation
- Office of Science
- United States Department of Energy