Mobility Anisotropy in Black Phosphorus MOSFETs With HfO2 Gate Dielectrics

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2018
Source ID
10.1109/ted.2018.2865440

Entities

People

  • Andre Mkhoyan
  • Nazila Haratipour
  • P. Paul Ruden
  • Ryan J. Wu
  • Sang-Hyun Oh
  • Seon Namgung
  • Steven J Koester
  • Yue Liu

Organizations

  • Air Force Office of Scientific Research
  • Division of Materials Research
  • National Natural Science Foundation of China