Analyzing the Effect of High-k Dielectric-Mediated Doping on Contact Resistance in Top-Gated Monolayer MoS2 Transistors

Document Details

Document Type: Pub Defense Publication
Publication Date: Oct 01, 2018
Source ID: 10.1109/ted.2018.2866772

Entities

People

Abdullah Alharbi
Davood Shahrjerdi

Organizations

Army Research Office
Brookhaven National Laboratory
National Science Foundation