Investigation of Trap-Induced Threshold Voltage Instability in GaN-on-Si MISHEMTs

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 01, 2019
Source ID
10.1109/ted.2018.2888840

Entities

People

  • Aaron R. Arehart
  • Christine M. Jackson
  • Jungwoo Joh
  • Sameer Pendharkar
  • Srikanth Krishnan
  • Steven A. Ringel
  • Wenyuan Sun

Organizations

  • Office of Naval Research