Resistive RAM Endurance: Array-Level Characterization and Correction Techniques Targeting Deep Learning Applications
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Mar 01, 2019
- Source ID
- 10.1109/ted.2019.2894387
Entities
People
- Alessandro Grossi
- Binh Le
- Cristian Zambelli
- Edith Beigne
- Elisa Vianello
- Etienne Nowak
- J. Coignus
- Laurent Grenouillet
- Marios Barlas
- Mary Wootters
- Mohamed M. Sabry Aly
- Subhasish Mitra
- Tony F. Wu
Organizations
- Defense Advanced Research Projects Agency
- Nanyang Technological University
- National Science Foundation