Single Pulse Charge Pumping Measurements on GaN MOS-HEMTs: Fast and Reliable Extraction of Interface Traps Density

Document Details

Document Type
Pub Defense Publication
Publication Date
Feb 01, 2020
Source ID
10.1109/ted.2019.2961090

Entities

People

  • Hagyoul Bae
  • Hong Zhou
  • Mengwei Si
  • Peide Ye
  • Sami Alghamdi

Organizations

  • Air Force Office of Scientific Research