Drain–Erase Scheme in Ferroelectric Field-Effect Transistor—Part I: Device Characterization

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 01, 2020
Source ID
10.1109/ted.2020.2969401

Entities

People

  • Asif Islam Khan
  • Jae Hur
  • Panni Wang
  • Shimeng Yu
  • Suman Datta
  • Wonbo Shim
  • Zheng Wang

Organizations

  • Defense Advanced Research Projects Agency
  • National Science Foundation