Trapping and Detrapping Mechanisms in β-Ga₂O₃ Vertical FinFETs Investigated by Electro-Optical Measurements

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2020
Source ID
10.1109/ted.2020.3013242

Entities

People

  • Alessandro Caria
  • Carlo De Santi
  • Debdeep Jena
  • E. Zanoni
  • Elena Fabris
  • Gaudenzio Meneghesso
  • Huili Grace Xing
  • Kazuki Nomoto
  • Matteo Meneghini
  • Wenshen Li
  • Zongyang Hu

Organizations

  • Air Force Office of Scientific Research
  • Manchester Royal Infirmary
  • National Science Foundation
  • University of Padua