Temperature Dependence of Electron and Hole Impact Ionization Coefficients in GaN

Document Details

Document Type
Pub Defense Publication
Publication Date
Mar 01, 2021
Source ID
10.1109/ted.2021.3054355

Entities

People

  • Anthony J. Hoffman
  • Galen Harden
  • Hansheng Ye
  • Jingshan Wang
  • Lina Cao
  • Patrick Fay
  • Zhongtao Zhu

Organizations

  • Office of Naval Research

Tags

Technology Areas

  • Microelectronics