Impact of Self-Heating on Negative-Capacitance FinFET: Device-Circuit Interaction

Document Details

Document Type
Pub Defense Publication
Publication Date
Apr 01, 2021
Source ID
10.1109/ted.2021.3059180

Entities

People

  • Chetan Kumar Dabhi
  • Girish Pahwa
  • Hussam Amrouch
  • Om Prakash
  • Yogesh S. Chauhan

Organizations

  • Office of Naval Research