Radiation Hardness Study of L G = 20 nm FinFET and Nanowire SRAM Through TCAD Simulation

Document Details

Document Type: Pub Defense Publication
Publication Date: May 01, 2021
Source ID: 10.1109/ted.2021.3067855

Entities

People

Adam Elwailly
Hiu Yung Wong
Johan Saltin
Matthew J. Gadlage

Organizations

United States Department of Defense