Single-Event Gate Rupture Hardened Structure for High-Voltage Super-Junction Power MOSFETs

Document Details

Document Type
Pub Defense Publication
Publication Date
Aug 01, 2021
Source ID
10.1109/ted.2021.3091952

Entities

People

  • A. A. Kalashnikova
  • A. E. Koziukov
  • A. Privat
  • Hugh Barnaby
  • K. B. Bu-khasan
  • K. Muthuseenu
  • Kenneth Galloway
  • M. Y. Vyrostkov
  • T. A. Maksimenko

Organizations

  • Defense Threat Reduction Agency