Demonstration of Constant-Gate-Charge Scaling to Increase the Robustness of Silicon Carbide Power MOSFETs

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2021
Source ID
10.1109/ted.2021.3099455

Entities

People

  • Cheryl A. Stellman
  • Clinton H. Anderson
  • Dallas Morisette
  • James Cooper
  • John A. Ransom
  • Madankumar Sampath
  • Michael J. Westphal
  • Stephen Bayne

Organizations

  • ARPA-E
  • United States Army Research Laboratory
  • United States Department of Energy