AC-Stress Degradation and Its Anneal in SiC MOSFETs
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Sep 01, 2022
- Source ID
- 10.1109/ted.2022.3190815
Entities
People
- Aivars J. Lelis
- Daniel B. Habersat
Organizations
- United States Army Research Laboratory