Comprehensive Variability Analysis in Dual-Port FeFET for Reliable Multi-Level-Cell Storage

Document Details

Document Type
Pub Defense Publication
Publication Date
Sep 01, 2022
Source ID
10.1109/ted.2022.3192808

Entities

People

  • Hussam Amrouch
  • Kai Ni
  • Simon Thomann
  • Swetaki Chatterjee
  • Yogesh Singh Chauhan

Organizations

  • Army Research Office
  • German Research Foundation
  • Indian Institute of Technology Kanpur
  • Rochester Institute of Technology
  • University of Stuttgart