Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 01, 2023
Source ID
10.1109/ted.2023.3265939

Entities

People

  • Brian D. Sierawski
  • Daniel M. Fleetwood
  • En Xia Zhang
  • Jingchen Cao
  • Jonathan Cox
  • K. Li
  • Mahmud Reaz
  • Mariia Gorchichko
  • Michael L. Alles
  • Pengfei Wang
  • Rachel M. Brewer
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Steven L. Moran
  • Subramanian S. Iyer

Organizations

  • Air Force Office of Scientific Research
  • University of California, Los Angeles
  • Vanderbilt University