Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Apr 01, 2017
- Source ID
- 10.1109/temc.2016.2644616
Entities
People
- Caitlyn M. Cooke
- Christopher L. Holloway
- David A. Anderson
- Georg Raithel
- Joshua A. Gordon
- Matthew T. Simons
- Perry F. Wilson
Organizations
- Defense Advanced Research Projects Agency
- National Institute of Standards and Technology