Remaining Useful Lifetime Estimation for Power MOSFETs Under Thermal Stress With RANSAC Outlier Removal

Document Details

Document Type
Pub Defense Publication
Publication Date
Jun 01, 2017
Source ID
10.1109/tii.2017.2665668

Entities

People

  • Bilal Akin
  • Mehrdad Heydarzadeh
  • Mehrdad Nourani
  • Serkan Düşmez

Organizations

  • National Science Foundation
  • Office of Naval Research