Condition Monitoring of SiC MOSFETs Based on Gate-Leakage Current Estimation

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2022
Source ID
10.1109/tim.2021.3137866

Entities

People

  • Arijit Banerjee
  • John S. Donnal
  • Patrick Wang

Organizations

  • Office of Naval Research