Materials Characterization With Multiple Offset Reflects at Frequencies to 110 GHz

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2020
Source ID
10.1109/tmtt.2019.2950023

Entities

People

  • Aaron M. Hagerstrom
  • Christian J. Long
  • Edward J. Garboczi
  • James C. Booth
  • Jasper A. Drisko
  • Nathan D Orloff
  • Nina B. Popovic

Organizations

  • Defense Advanced Research Projects Agency
  • National Institute of Standards and Technology