Characterization of Heavy-Ion-Induced Single-Event Effects in 65 nm Bulk CMOS ASIC Test Chips

Document Details

Document Type
Pub Defense Publication
Publication Date
Oct 01, 2014
Source ID
10.1109/tns.2014.2342872

Entities

People

  • Chia-hsiang Chen
  • Phil Knag
  • Zhengya Zhang

Organizations

  • Defense Advanced Research Projects Agency
  • National Aeronautics and Space Administration