Irradiation and Temperature Effects for a 32 nm RF Silicon-on-Insulator CMOS Process

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2014
Source ID
10.1109/tns.2014.2360455

Entities

People

  • Andrew L. Sternberg
  • D. M. Fleetwood
  • En Xia Zhang
  • J. S. Kauppila
  • L. W. Massengill
  • M. L. Alles
  • N. F. Haddad
  • R. D. Schrimpf
  • S. Jagannathan
  • T. D. Haeffner
  • T. D. Loveless

Organizations

  • Defense Threat Reduction Agency

Tags

Technology Areas

  • Microelectronics