Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2014
Source ID
10.1109/tns.2014.2368125

Entities

People

  • Arthur F. Witulski
  • Brian D. Sierawski
  • Daniel Herbison
  • E. Bryn Pitt
  • Eric J. Barth
  • Gabor Karsai
  • Michael L. Alles
  • Nagabhushan Mahadevan
  • Robert A. Reed
  • Robert A. Weller
  • Ronald D. Schrimpf
  • Zachary J. Diggins

Organizations

  • Defense Threat Reduction Agency