Total Ionizing Dose Effects on Ge Channel $p$FETs with Raised ${\rm Si}_{0.55}{\rm Ge}_{0.45}$ Source/Drain

Document Details

Document Type
Pub Defense Publication
Publication Date
Dec 01, 2015
Source ID
10.1109/tns.2015.2489019

Entities

People

  • Cher Xuan Zhang
  • Daniel M. Fleetwood
  • Dimitri Linten
  • En Xia Zhang
  • Guo Xing Duan
  • Isaak K. Samsel
  • Jerome Mitard
  • Jordan A Hachtel
  • Kenneth F. Galloway
  • Liang Wang
  • Liesbeth Witters
  • Matthew F. Chisholm
  • Michael L. Alles
  • Nadine Collaert
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Sokrates T. Pantelides

Organizations

  • Air Force Office of Scientific Research
  • Air Force Research Laboratory
  • Oak Ridge National Laboratory