Characterizing Radiation and Stress-Induced Degradation in an Embedded Split-Gate NOR Flash Memory
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Apr 01, 2016
- Source ID
- 10.1109/tns.2016.2540803
Entities
People
- Adam R. Duncan
- Austin H. Roach
- Matthew J. Gadlage
- Matthew J. Kay
Organizations
- Naval Sea Systems Command