Total Ionizing Dose Effects on HfO2-Passivated Black Phosphorus Transistors

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2017
Source ID
10.1109/tns.2016.2616282

Entities

People

  • Chunlei Liang
  • D. M. Fleetwood
  • En Xia Zhang
  • K. Ni
  • M. L. Alles
  • R. D. Schrimpf
  • S. J. Koester
  • Yifan Su

Organizations

  • Defense Threat Reduction Agency