Total Ionizing Dose Effects on a High-Voltage (>30V) Complementary SiGe on SOI Technology

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2017
Source ID
10.1109/tns.2016.2617201

Entities

People

  • Adilson S. Cardoso
  • Adrian Ildefonso
  • Anup P. Omprakash
  • Daniel M. Fleetwood
  • En Xia Zhang
  • Jeffrey Babcock
  • John D. Cressler
  • Nelson E. Lourenco
  • Patrick J. Mcmarr
  • Rajarshi Mukhopadhyay
  • Uppili S. Raghunathan
  • Zachary E. Fleetwood

Organizations

  • Defense Threat Reduction Agency
  • Texas Instruments