Total-Ionizing-Dose Effects on Resistance Stability of Programmable Metallization Cell Based Memory and Selectors

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2017
Source ID
10.1109/tns.2016.2618359

Entities

People

  • A. Mahmud
  • Arthur H. Edwards
  • Hugh Barnaby
  • J. L. Taggart
  • K. Holbert
  • M. B. Balaban
  • Michael N. Kozicki
  • R. Fang
  • Wei Chen
  • Y. Gonzalez-Velo

Organizations

  • Air Force Research Laboratory
  • Defense Threat Reduction Agency