Ionizing Radiation Effects in 4H-SiC nMOSFETs Studied With Electrically Detected Magnetic Resonance

Document Details

Document Type: Pub Defense Publication
Publication Date: Jan 01, 2017
Source ID: 10.1109/tns.2016.2622159

Entities

People

Aivars J. Lelis
Mark Anders
Patrick M. Lenahan
Ryan J Waskiewicz

Organizations

United States Army Research Laboratory