Persistent Laser-Induced Leakage in a 20 nm Charge-Pump Phase-Locked Loop (PLL)
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Jan 01, 2017
- Source ID
- 10.1109/tns.2016.2627940
Entities
People
- Andrew L. Sternberg
- B. L. Bhuva
- Dale McMorrow
- En Xia Zhang
- J. S. Kauppila
- L. W. Massengill
- M. L. Alles
- R. D. Schrimpf
- Robert A. Reed
- T. D. Loveless
- W. T. Holman
- Yanran P. Chen
Organizations
- Defense Threat Reduction Agency