Total Ionizing Dose Effects on Strained Ge pMOS FinFETs on Bulk Si

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2017
Source ID
10.1109/tns.2016.2635023

Entities

People

  • Chundong Liang
  • Daniel M. Fleetwood
  • Dimitri Linten
  • En Xia Zhang
  • Jerome Mitard
  • Jordan A Hachtel
  • Matthew F. Chisholm
  • Michael L. Alles
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Sokrates T. Pantelides

Organizations

  • Air Force Research Laboratory Information Directorate
  • Defense Threat Reduction Agency
  • United States Department of Energy