Combined Effects of Total Ionizing Dose and Temperature on a K-Band Quadrature LC-Tank VCO in a 32 nm CMOS SOI Technology

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2017
Source ID
10.1109/tns.2016.2637699

Entities

People

  • D. M. Fleetwood
  • En Xia Zhang
  • J. S. Kauppila
  • L. W. Massengill
  • S. Jagannathan
  • T. D. Haeffner
  • T. D. Loveless

Organizations

  • Defense Threat Reduction Agency