Effects of Threshold Voltage Variations on Single-Event Upset Response of Sequential Circuits at Advanced Technology Nodes

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2017
Source ID
10.1109/tns.2016.2637873

Entities

People

  • Balaji Narasimham
  • Bharat L. Bhuva
  • H. Zhang
  • Hui Jiang
  • L. W. Massengill
  • Nihaar N. Mahatme
  • Richard Wong
  • Shi-jie Wen
  • Thiago R. Assis

Organizations

  • Defense Threat Reduction Agency