Angular Effects of Heavy-Ion Strikes on Single-Event Upset Response of Flip-Flop Designs in 16-nm Bulk FinFET Technology

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2017
Source ID
10.1109/tns.2016.2637876

Entities

People

  • Ali Anvar
  • Balaji Narasimham
  • Bharat L. Bhuva
  • Dennis R. Ball
  • H. Zhang
  • Hui Jiang
  • L. W. Massengill
  • Thiago R. Assis

Organizations

  • Defense Threat Reduction Agency