Understanding Charge Collection Mechanisms in InGaAs FinFETs Using High-Speed Pulsed-Laser Transient Testing With Tunable Wavelength
Document Details
- Document Type
- Pub Defense Publication
- Publication Date
- Aug 01, 2017
- Source ID
- 10.1109/tns.2017.2699482
Entities
People
- Alon Vardi
- Andrew L. Sternberg
- Dale McMorrow
- Daniel M. Fleetwood
- En Xia Zhang
- Jesus Del Alamo
- Jianqiang Lin
- John A. Kozub
- Kai Ni
- Michael L. Alles
- Robert A. Reed
- Ronald D. Schrimpf
- Rong Jiang
Organizations
- Defense Threat Reduction Agency