Proton-Induced Displacement Damage and Total-Ionizing-Dose Effects on Silicon-Based MEMS Resonators

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2018
Source ID
10.1109/tns.2017.2749180

Entities

People

  • Andrew L. Sternberg
  • Bruce Alphenaar
  • Daniel M. Fleetwood
  • En Xia Zhang
  • Huiqi Gong
  • J. L. Davidson
  • Ji-Tzuoh Lin
  • Kevin M. Walsh
  • Michael L. Alles
  • Michael W. McCurdy
  • Pranoy Deb Shuvra
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Shamus McNamara
  • Wenjun Liao

Organizations

  • Defense Threat Reduction Agency