Capacitance–Frequency Estimates of Border-Trap Densities in Multifin MOS Capacitors

Document Details

Document Type
Pub Defense Publication
Publication Date
Jan 01, 2018
Source ID
10.1109/tns.2017.2761298

Entities

People

  • Chundong Liang
  • Daniel M. Fleetwood
  • Dimitri Linten
  • En Xia Zhang
  • Jerome Mitard
  • Nadine Collaert
  • Niamh Waldron
  • Robert A. Reed
  • Ronald D. Schrimpf
  • Rong Jiang
  • Simeng Zhao
  • Sonja Sioncke
  • Wenjun Liao

Organizations

  • Defense Threat Reduction Agency